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Proceedings Paper

Advanced trend removal in 3D noise calculation
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Paper Abstract

While it is now common practice to use a trend removal to eliminate low frequency xed pattern noise in thermal imaging systems, there is still some disagreement as to whether one means of trend removal is better than another and whether or not the strength of the trend removal should be limited. The dierent methods for trend removal will be presented as well as an analysis of the calculated noise as a function of their strengths will be presented for various thermal imaging systems. In addition, trend removals were originally put in place in order to suppress the low-frequency component of the Sigma VH term. It is now prudent to perform a trend removal at an intermediate noise calculation step in order to suppress the low frequency component of both the Sigma V and Sigma H components. A discussion of the ramications of this change in measurement will be included for thermal modeling considerations.

Paper Details

Date Published: 18 May 2012
PDF: 7 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 835509 (18 May 2012); doi: 10.1117/12.917726
Show Author Affiliations
Stephen D. Burks, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Quang Nguyen, U.S. Army Night Vision & Electronic Sensors Directorate (United States)


Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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