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Proceedings Paper

Measurement of electro-optic effects in near-intrinsic silicon
Author(s): Jinbo Mu; Jingcheng Zhu; Zhenyu Wang; Zhanguo Chen; Xiuhuan Liu; Yanjun Gao; Gang Jia
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Paper Abstract

The electro-optic effects in silicon include Kerr effect, plasma dispersion effect, and Franz-Keldysh effect etc.. Silicon does not have the linear electro-optic effect in the bulk because of the inversion symmetry, which restricts the development of the silicon-based optoelectronics and silicon photonics. However, the electric field can destroy the inversion symmetry of silicon, and produce so-called electric-field-induced linear electro-optic effect. In intrinsic or near-intrinsic silicon, these electro-optic effects exist simultaneously. In this paper, a transverse electro-optic modulation system was designed to detect these electro-optic effects. The electric-field-induced linear electro-optic effect was demonstrated in the space charge region of silicon sample and distinguished from Kerr effect based on the different frequency response. The relationship between the linear electro-optic signal and the azimuth angle of the analyzer was measured too, which was used for distinguishing the electric-field-induced linear electro-optic effect from the plasma dispersion effect. The results showed that the electric-field-induced linear electro-optic effect was stronger than Kerr effect and the plasma dispersion effect in the near-intrinsic silicon samples.

Paper Details

Date Published: 15 November 2011
PDF: 7 pages
Proc. SPIE 8335, 2012 International Workshop on Image Processing and Optical Engineering, 833502 (15 November 2011); doi: 10.1117/12.917589
Show Author Affiliations
Jinbo Mu, Jilin Univ. (China)
Jingcheng Zhu, Jilin Univ. (China)
Zhenyu Wang, Jilin Univ. (China)
Zhanguo Chen, Jilin Univ. (China)
Xiuhuan Liu, Jilin Univ. (China)
Yanjun Gao, Jilin Univ. (China)
Gang Jia, Jilin Univ. (China)


Published in SPIE Proceedings Vol. 8335:
2012 International Workshop on Image Processing and Optical Engineering
Hai Guo; Qun Ding, Editor(s)

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