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Proceedings Paper

Optical properties of TiO2 thin film grown on quartz substrate by sol-gel method
Author(s): Jianjun Tian; Hongmei Deng; Lin Sun; Hui Kong; Pingxiong Yang; Junhao Chu
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Paper Abstract

TiO2 film was deposited on quartz substrate by sol-gel method. X-ray diffraction analysis and Raman scattering measurement indicate that the TiO2 film is the pure rutile phase structure. From photoluminescence spectra, it is found that the TiO2 film shows a near-infrared luminescence band centered at about 832 nm, and two visible luminescence bands centered at about 426 nm and 524 nm, respectively. The refractive index n, extinct coefficient k, optical band gap EOBG and thickness d of TiO2 film were extracted by fitting transmission spectra with the Adachi's dielectric function model and a three-phase layered model. It is found that n value increases and then decreases with increasing wavelength, while k decreases continuously. The thickness of TiO2 film is about 297 nm. EOBG value is about 3.72eV and larger than that attained by Tauc's law, which is about 3.28eV.

Paper Details

Date Published: 22 February 2012
PDF: 8 pages
Proc. SPIE 8333, Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Devices and Integration, 83331D (22 February 2012); doi: 10.1117/12.916849
Show Author Affiliations
Jianjun Tian, East China Normal Univ. (China)
Hongmei Deng, Shanghai Univ. (China)
Lin Sun, East China Normal Univ. (China)
Hui Kong, East China Normal Univ. (China)
Pingxiong Yang, East China Normal Univ. (China)
Junhao Chu, East China Normal Univ. (China)


Published in SPIE Proceedings Vol. 8333:
Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Devices and Integration
Erich Kasper; Jinzhong Yu; Xun Li; Xinliang Zhang; Jinsong Xia; Junhao Chu; Zhijiang Dong; Bin Hu; Yan Shen, Editor(s)

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