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Proceedings Paper

Long distance measurement with submicrometer accuracy
Author(s): N. Bhattacharya; M. Cui; M. G. Zeitouny; H. P. Urbach; S. A. van den Berg
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Paper Abstract

The invention of the femto-second frequency comb laser has revolutionized the field of high-resolution spectroscopy, by providing very accurate reference frequencies in the optical domain, acting as a 'frequency ruler'. Similarly, a frequency comb can be viewed as a ruler for distance measurement, which is based on the fact that the vacuum distance between subsequent pulses is known with the accuracy of the used time standard. We have recently demonstrated absolute distance measurements using a FC laser applying a cross-correlation technique, which was supported by a theoretical and a numerical study on the formation of cross-correlation in dispersive media. In this contribution a measurement scheme based on dispersive (spectral) interferometry is presented. For the measurement of distances up to 50 meter, sub-micrometer accuracy is achieved.

Paper Details

Date Published: 18 November 2011
PDF: 10 pages
Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 819703 (18 November 2011); doi: 10.1117/12.916790
Show Author Affiliations
N. Bhattacharya, Technische Univ. Delft (Netherlands)
M. Cui, Technische Univ. Delft (Netherlands)
M. G. Zeitouny, Technische Univ. Delft (Netherlands)
H. P. Urbach, Technische Univ. Delft (Netherlands)
S. A. van den Berg, VSL (Netherlands)


Published in SPIE Proceedings Vol. 8197:
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Han-Ping Shieh; Kimio Tatsuno, Editor(s)

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