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Proceedings Paper

Adaptive scene-based correction algorithm for removal of residual fixed pattern noise in microgrid image data
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Paper Abstract

Pixel-to-pixel response nonuniformity is a common problem that affects nearly all focal plane array sensors. This results in a frame-to-frame fixed pattern noise (FPN) that causes an overall degradation in collected data. FPN is often compensated for through the use of blackbody calibration procedures; however, FPN is a particularly challenging problem because the detector responsivities drift relative to one another in time, requiring that the sensor be recalibrated periodically. The calibration process is obstructive to sensor operation and is therefore only performed at discrete intervals in time. Thus, any drift that occurs between calibrations (along with error in the calibration sources themselves) causes varying levels of residual calibration error to be present in the data at all times. Polarimetric microgrid sensors are particularly sensitive to FPN due to the spatial differencing involved in estimating the Stokes vector images. While many techniques exist in the literature to estimate FPN for conventional video sensors, few have been proposed to address the problem in microgrid imaging sensors. Here we present a scene-based nonuniformity correction technique for microgrid sensors that is able to reduce residual fixed pattern noise while preserving radiometry under a wide range of conditions. The algorithm requires a low number of temporal data samples to estimate the spatial nonuniformity and is computationally efficient. We demonstrate the algorithm's performance using real data from the AFRL PIRATE and University of Arizona LWIR microgrid sensors.

Paper Details

Date Published: 11 June 2012
PDF: 11 pages
Proc. SPIE 8364, Polarization: Measurement, Analysis, and Remote Sensing X, 83640N (11 June 2012); doi: 10.1117/12.916697
Show Author Affiliations
Bradley M. Ratliff, Space Computer Corp. (United States)
Daniel A. LeMaster, U.S. Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 8364:
Polarization: Measurement, Analysis, and Remote Sensing X
David B. Chenault; Dennis H. Goldstein, Editor(s)

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