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Proceedings Paper

Thermal modeling of the TMT Telescope
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Paper Abstract

Thermal modeling of the Thirty Meter Telescope (TMT) was conducted for evaluations of thermal performances by finite element (FE) and optical analysis tools. The thermal FE models consist of the telescope optical assembly systems, instruments, laser facility, control and electronic equipments, and telescope structural members. A three-consecutive-day thermal environment data was implemented for the thermal boundary created by Computational Fluid Dynamics (CFD) based on the environment conditions of the TMT site. Temporal and spatial temperature distributions of the optical assembly systems and the telescope structure were calculated under the environmental thermal conditions including air convections, conductions, heat flux loadings, and radiations. With the calculated temperature distributions, the thermo-elastic analysis was performed to predict thermal deformations of the telescope structure and the optical systems. The line of sight calculation was made using the thermally induced deformations of the optics and structures. Merit function routines (MFR) were utilized to calculate the Optical Path Difference (OPD) maps after repositioning the optics based on a best fit of M1 segment deformations. The goal of this thermal modeling is to integrate the mechanical and optical deformations in order to simulate the thermal effects with the TMT site environment data from CFD.

Paper Details

Date Published: 10 November 2011
PDF: 17 pages
Proc. SPIE 8336, Integrated Modeling of Complex Optomechanical Systems, 83360V (10 November 2011); doi: 10.1117/12.915634
Show Author Affiliations
Myung Cho, National Optical Astronomy Observatory (United States)
Andrew Corredor, Univ. of Arizona (United States)
Konstantinos Vogiatzis, California Institute of Technology (United States)
George Angeli, California Institute of Technology (United States)


Published in SPIE Proceedings Vol. 8336:
Integrated Modeling of Complex Optomechanical Systems
Torben Andersen; Anita Enmark, Editor(s)

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