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Admittance-based damage detection method using a higher-order circuitFormat | Member Price | Non-Member Price |
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Paper Abstract
An admittance-based damage detection method with a higher-order circuit is proposed and investigated in this paper, in
order to increase the damage detection sensitivity. The change of the stiffness in the structure due to the damages can be
detected by measuring the admittance from the piezoelectric transducer adhered on the host structure. It is known that an
inductive circuitry of an R-L-in-series branch serially connected with the piezoelectric transducer can introduce an
additional resonance to the mechanical system. With the piezoelectric capacitance, it is a second-order circuit system
with two resonances. In this research, based on the electrical-mechanical analogy, a higher-order circuit is designed to
improve the damage detection capability, i.e., increasing the admittance magnitude and the admittance sensitivity
magnitude. Theoretical analyses and simulations are carried out. The results show that the admittance magnitude and the
admittance sensitivity are both significantly increased by using the higher-order circuit when comparing with the
second-order circuit, both without electrical damping.
Paper Details
Date Published: 18 April 2012
PDF: 11 pages
Proc. SPIE 8348, Health Monitoring of Structural and Biological Systems 2012, 83480I (18 April 2012); doi: 10.1117/12.915570
Published in SPIE Proceedings Vol. 8348:
Health Monitoring of Structural and Biological Systems 2012
Tribikram Kundu, Editor(s)
PDF: 11 pages
Proc. SPIE 8348, Health Monitoring of Structural and Biological Systems 2012, 83480I (18 April 2012); doi: 10.1117/12.915570
Show Author Affiliations
Wanlu Zhou, Stony Brook Univ./SUNY (United States)
Gopinath Reddy Penamalli, Stony Brook Univ./SUNY (United States)
Gopinath Reddy Penamalli, Stony Brook Univ./SUNY (United States)
Lei Zuo, Stony Brook Univ./SUNY (United States)
Published in SPIE Proceedings Vol. 8348:
Health Monitoring of Structural and Biological Systems 2012
Tribikram Kundu, Editor(s)
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