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Proceedings Paper

Entropyology: microarray analysis analogy for digital artifact discrimination
Author(s): Holger Jaenisch; James Handley
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Paper Abstract

We successfully introduce an analogy of microarray analysis for robust exemplar selection to enable optimal classification. The microarray is analogous to the Spatial Voting (SV) grid, where digital artifacts are stacked onto the grid and grid cells are colored red if only the experiment samples (Class 1) are present, green if only control samples (Class 2) are present, and yellow if both classes are present. We use this information to determine if the exemplars are to be placed in the training, validation, or test dataset. The bytes of these digital artifacts are converted into ASCII values, characterized using the recursive form of higher order parametric and non-parametric statistics, and classifiers derived for discrimination and classification. The results and findings of our work are presented here.

Paper Details

Date Published: 22 June 2012
PDF: 20 pages
Proc. SPIE 8359, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense XI, 83590A (22 June 2012); doi: 10.1117/12.914730
Show Author Affiliations
Holger Jaenisch, Johns Hopkins Univ. (United States)
Licht Strahl Engineering Inc. (United States)
James Handley, Licht Strahl Engineering Inc. (United States)


Published in SPIE Proceedings Vol. 8359:
Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense XI
Edward M. Carapezza, Editor(s)

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