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Proceedings Paper

Development of nanostructure based antireflection coatings for EO/IR sensor applications
Author(s): Ashok K. Sood; Roger E. Welser; Adam W. Sood; Yash R. Puri; David Poxson; Jaehee Cho; E. Fred Schubert; Nibir K. Dhar; Martin B. Soprano; Raymond S. Balcerak
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Paper Abstract

EO/IR Nanosensors are being developed for a variety of Defense and Commercial Systems Applications. These include UV, Visible, NIR, MWIR and LWIR Nanotechnology based Sensors. The conventional SWIR Sensors use InGaAs based IR Focal Plane Array (FPA) that operate in 1.0-1.8 micron region. Similarly, MWIR Sensors use InSb or HgCdTe based FPA that is sensitive in 3-5 micron region. More recently, there is effort underway to evaluate low cost SiGe visible and near infrared band that covers from 0.4 to 1.6 micron and beyond to 1.8 microns. One of the critical technologies that will enhance the EO/IR sensor performance is the development of high quality nanostructure based antireflection coating. In this paper, we will discuss our modeling approach and experimental results for using oblique angle nanowires growth technique for extending the application for UV, Visible and NIR sensors and their utility for longer wavelength application. The AR coating is designed by using a genetic algorithm and fabricated by using oblique angle deposition. The AR coating is designed for the wavelength range of 250 nm to 2500 nm and 0° to 40° angle of incidence. These nanostructure AR coatings have shown to enhance the optical transmission in the band of interest and minimize the reflection loss to less than 3 percent substantial improvement from the thin film AR coatings technology.

Paper Details

Date Published: 19 March 2012
PDF: 10 pages
Proc. SPIE 8257, Optical Components and Materials IX, 82571C (19 March 2012); doi: 10.1117/12.914374
Show Author Affiliations
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
Roger E. Welser, Magnolia Optical Technologies, Inc. (United States)
Adam W. Sood, Magnolia Optical Technologies, Inc. (United States)
Yash R. Puri, Magnolia Optical Technologies, Inc. (United States)
David Poxson, Rensselaer Polytechnic Institute (United States)
Jaehee Cho, Rensselaer Polytechnic Institute (United States)
E. Fred Schubert, Rensselaer Polytechnic Institute (United States)
Nibir K. Dhar, Defense Advanced Research Projects Agency (United States)
Martin B. Soprano, U.S. Army Research, Development and Engineering Command (United States)
Raymond S. Balcerak, Consultant (United States)


Published in SPIE Proceedings Vol. 8257:
Optical Components and Materials IX
Shibin Jiang; Michel J. F. Digonnet; J. Christopher Dries, Editor(s)

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