Share Email Print
cover

Proceedings Paper

Facial classification using artificial neural network techniques
Author(s): A. J. Nor'aini; Z. Fatimah; R. Norzilah
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Changes in illumination condition, pose, facial expression and others are challenging task in recognizing face images. Solving these problems requires a feature extractor that can generate distinct features for each class of image as well as classifier that able to recognize and classify the face image precisely. This paper presents a facial recognition system using Artificial Neural network (ANN) techniques namely Radial basis function and Feed forward neural networks. Invariant continuous orthogonal moment that is Zernike moment (ZM) at order 2 to 12 is used to extract 47 features which are the inputs to the neural network. The experiments were carried out on the database face images from the AT&T Laboratories Cambridge University consisting of 40 distinct subjects of 10 non-similar images each. For some subjects, the images were taken at different times, varying the lighting, facial expressions (open/closed eyes, smiling/not smiling), facial details (with and without spectacles) and different face scale. From the experiments, Radial basis function outperforms feed forward in terms of percentage classification. However the classification error of feed forward neural network is below 5%.

Paper Details

Date Published: 1 October 2011
PDF: 8 pages
Proc. SPIE 8285, International Conference on Graphic and Image Processing (ICGIP 2011), 82857K (1 October 2011); doi: 10.1117/12.913530
Show Author Affiliations
A. J. Nor'aini, Univ. Teknologi MARA (Malaysia)
Z. Fatimah, Univ. Teknologi MARA (Malaysia)
R. Norzilah, Univ. Teknologi MARA (Malaysia)


Published in SPIE Proceedings Vol. 8285:
International Conference on Graphic and Image Processing (ICGIP 2011)
Yi Xie; Yanjun Zheng, Editor(s)

© SPIE. Terms of Use
Back to Top