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Proceedings Paper

Local measurement of solar cell emission characteristics
Author(s): Pavel Škarvada; Pavel Tománek; Lubomír Grmela
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Paper Abstract

Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial damage defects. Finally, the scratched areas are inspected as sites of local structure damage.

Paper Details

Date Published: 11 October 2011
PDF: 7 pages
Proc. SPIE 8306, Photonics, Devices, and Systems V, 83061H (11 October 2011); doi: 10.1117/12.912310
Show Author Affiliations
Pavel Škarvada, Brno Univ. of Technology (Czech Republic)
Pavel Tománek, Brno Univ. of Technology (Czech Republic)
Lubomír Grmela, Brno Univ. of Technology (Czech Republic)

Published in SPIE Proceedings Vol. 8306:
Photonics, Devices, and Systems V
Pavel Tománek; Dagmar Senderáková; Petr Páta, Editor(s)

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