Share Email Print
cover

Proceedings Paper

Detecting surface deformation by phase stacking based on the PS
Author(s): Ming Hao; Kazhong Deng; Hongdong Fan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In the surface deformation monitoring, synthetic aperture radar differential interferometry (D-InSAR) has the advantages of all-weather, large-scale and high accuracy, it is hard to form interferogram for limited factors such as spatial decorrelation, temporal decorrelation and atmospheric effect. For the reason, the method of PS-DInSAR was proposed. However, the method needs so many SAR images, more than twenty scenes. Therefore, the method based on the phase stacking of PS for surface deformation monitoring was proposed and verified. The PS-DInSAR model and D-InSAR model are combined and simplified under certain conditions that assume the phase error of atmospheric disturbances are random and equal in an interferogram and the deformation is linear. The optimal master image for interferometric combinations is selected by comprehensive correlation function model. Then the PS points are detected and the Delaunay triangle is established according to the PS. The Minimum Cost Flow is used based on the Delaunay triangle of PS to unwrap the phase. Then the deformation and deformation rate are obtained by the linear analysis for temporal series of interferograms. At last, nine ENVISAT images captured during 2003.6-2006.3 in Tianjin area were processed, and the mean subsidence rate of this area was obtained.

Paper Details

Date Published: 24 October 2011
PDF: 7 pages
Proc. SPIE 8286, International Symposium on Lidar and Radar Mapping 2011: Technologies and Applications, 82861C (24 October 2011); doi: 10.1117/12.912306
Show Author Affiliations
Ming Hao, China Univ. of Mining and Technology (China)
Kazhong Deng, China Univ. of Mining and Technology (China)
Hongdong Fan, China Univ. of Mining and Technology (China)


Published in SPIE Proceedings Vol. 8286:
International Symposium on Lidar and Radar Mapping 2011: Technologies and Applications
Jonathan Li, Editor(s)

© SPIE. Terms of Use
Back to Top