Share Email Print
cover

Proceedings Paper

Study on infrared absorption of tungsten nanofilms
Author(s): Xiaoxiong Zhou; Andi Zhao; Mingquan Yuan; Xiaomei Yu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Thin metallic films have several potential applications in MEMS field, and one of them is used as infrared absorber. In this paper, we first build a model of metallic infrared absorption and then discuss the transmission characteristics of infrared through metal and dielectric film. For a thin film material, the maximum absorption will occur when its sheet resistance equals to the impedance of free space. In order to verify the absorption property, tungsten (W) nanofilms with different thicknesses have been deposited and their characteristics of infrared absorption were experimentally studied. The infrared absorbance of W nanofilms increased as the thickness of the films increased; more than 50% IR radiation could be absorbed by W nanofilms at the wavelength of 8-12 μm.

Paper Details

Date Published: 28 November 2011
PDF: 7 pages
Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 820217 (28 November 2011); doi: 10.1117/12.911878
Show Author Affiliations
Xiaoxiong Zhou, Peking Univ. (China)
Andi Zhao, Beijing Institute of Technology (China)
Mingquan Yuan, Peking Univ. (China)
Xiaomei Yu, Peking Univ. (China)


Published in SPIE Proceedings Vol. 8202:
2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
Hoi Sing Kwok; Fengzhou Fang; Lian Xiang Yang; Chongxiu Yu; Albert A. Weckenmann; Yanbing Hou; Jinxue Wang; Ji Zhao; Jinxue Wang; Peter Zeppenfeld; Boyu Ding; Boyu Ding; Liquan Dong; Liquan Dong; Jack K. Luo; Boyu Ding; Liquan Dong; Jinxue Wang, Editor(s)

© SPIE. Terms of Use
Back to Top