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Proceedings Paper

DynAMITe: a prototype large area CMOS APS for breast cancer diagnosis using x-ray diffraction measurements
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Paper Abstract

X-ray diffraction studies are used to identify specific materials. Several laboratory-based x-ray diffraction studies were made for breast cancer diagnosis. Ideally a large area, low noise, linear and wide dynamic range digital x-ray detector is required to perform x-ray diffraction measurements. Recently, digital detectors based on Complementary Metal-Oxide- Semiconductor (CMOS) Active Pixel Sensor (APS) technology have been used in x-ray diffraction studies. Two APS detectors, namely Vanilla and Large Area Sensor (LAS), were developed by the Multidimensional Integrated Intelligent Imaging (MI-3) consortium to cover a range of scientific applications including x-ray diffraction. The MI-3 Plus consortium developed a novel large area APS, named as Dynamically Adjustable Medical Imaging Technology (DynAMITe), to combine the key characteristics of Vanilla and LAS with a number of extra features. The active area (12.8 × 13.1 cm2) of DynaMITe offers the ability of angle dispersive x-ray diffraction (ADXRD). The current study demonstrates the feasibility of using DynaMITe for breast cancer diagnosis by identifying six breast-equivalent plastics. Further work will be done to optimize the system in order to perform ADXRD for identification of suspicious areas of breast tissue following a conventional mammogram taken with the same sensor.

Paper Details

Date Published: 9 March 2012
PDF: 8 pages
Proc. SPIE 8313, Medical Imaging 2012: Physics of Medical Imaging, 83135H (9 March 2012); doi: 10.1117/12.911541
Show Author Affiliations
A. Konstantinidis, Univ. College London (United Kingdom)
T. Anaxagoras, Univ. of Lincoln (United Kingdom)
M. Esposito, Univ. of Surrey (United Kingdom)
N. Allinson, Univ. of Lincoln (United Kingdom)
R. Speller, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 8313:
Medical Imaging 2012: Physics of Medical Imaging
Norbert J. Pelc; Robert M. Nishikawa; Bruce R. Whiting, Editor(s)

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