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Proceedings Paper

Investigation of the photon emission from p-n junction of silicon solar cells studied by electro-optical methods
Author(s): Roberrt Macku; Pavel Koktavy; Pavel Tomanek
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Paper Abstract

We investigate localized defects of silicon solar cells. These imperfections represent real problem because of solar cell long-term degradation and decreasing conversion efficiency. To solve this issue, this paper does systematic research about optical investigation of local defect spots and correlation with rectangular microplasma fluctuation. Sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Nevertheless, we confine ourselves to bulk defects of potential barrier. We managed to get interesting information using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in this paper in detail.

Paper Details

Date Published: 11 October 2011
PDF: 7 pages
Proc. SPIE 8306, Photonics, Devices, and Systems V, 83061I (11 October 2011); doi: 10.1117/12.911322
Show Author Affiliations
Roberrt Macku, Brno Univ. of Technology (Czech Republic)
Pavel Koktavy, Brno Univ. of Technology (Czech Republic)
Pavel Tomanek, Brno Univ. of Technology (Czech Republic)


Published in SPIE Proceedings Vol. 8306:
Photonics, Devices, and Systems V
Pavel Tománek; Dagmar Senderáková; Petr Páta, Editor(s)

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