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Proceedings Paper

Subpicosecond laser breakdown in optical thin films
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Paper Abstract

Experimental and theoretical progress on subpicosecond laser pulse breakdown in dielectric films is reviewed. The single pulse threshold fluences can be related to fundamental material properties and scaling laws with respect to pulse duration and material bandgap. Multiple pulse thresholds are controlled by native and laser-induced defects. A phenomenological model is introduced which describes the accumulation and relaxation of such defects. The model is able to explain the experiments and can be used to assess relevant defect parameters. Experimental results are presented that exemplify how the ambient atmosphere affects the multiple-pulse laser damage thresholds.

Paper Details

Date Published: 12 January 2012
PDF: 8 pages
Proc. SPIE 8206, Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers, 82060D (12 January 2012); doi: 10.1117/12.911285
Show Author Affiliations
W. Rudolph, The Univ. of New Mexico (United States)
L. A. Emmert, The Univ. of New Mexico (United States)
D. Nguyen, The Univ. of New Mexico (United States)
C. Karras, The Univ. of New Mexico (United States)
Z. Sun, The Univ. of New Mexico (United States)
R. Weber, The Univ. of New Mexico (United States)


Published in SPIE Proceedings Vol. 8206:
Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers
Jianda Shao, Editor(s)

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