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Proceedings Paper

Study of the laser-induced damage in DKDP crystal
Author(s): Baoan Liu; Lailin Ji; Guohang Hu; Yuanan Zhao; Mingxia Xu; Shaohua Ji; Lili Zhu; Lisong Zhang; Zhengping Wang; Xun Sun; Xinguang Xu
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Paper Abstract

The crucial problem of DKDP crystal for third harmonic generation (THG) is its low laser-induced damage threshold with respect to KDP, which greatly limits energy fluence of the output laser and crystals' useful life. In order to study the relation between wavelength and laser-induced damage of DKDP, we carried out some related experiments in present work. DKDP crystal was conventionally grown from 80%-deuterated solution of high pure materials and the crystal was cut to tripler sample of type II. Laser-induced damage threshold of DKDP crystal for THG was measured under different wavelengths and the effect of laser annealing was also investigated. The experiment shows that laser annealing could obviously improve laser-induced damage threshold of DKDP crystal. The threshold is improved to 1.4, 1.9 or 2.7 times that before annealing for fundamental, second or third harmonic, respectively. Thus laser annealing is an effective approach to enhance laser-induced damage resistance of DKDP crystal.

Paper Details

Date Published: 12 January 2012
PDF: 6 pages
Proc. SPIE 8206, Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers, 82062H (12 January 2012); doi: 10.1117/12.910489
Show Author Affiliations
Baoan Liu, Shandong Univ. (China)
Lailin Ji, Shanghai Institute of Laser Plasmas (China)
Guohang Hu, Shanghai Institute of Optics and Fine Mechanics (China)
Yuanan Zhao, Shanghai Institute of Optics and Fine Mechanics (China)
Mingxia Xu, Shandong Univ. (China)
Shaohua Ji, Shandong Univ. (China)
Lili Zhu, Shandong Univ. (China)
Lisong Zhang, Shandong Univ. (China)
Zhengping Wang, Shandong Univ. (China)
Xun Sun, Shandong Univ. (China)
Xinguang Xu, Shandong Univ. (China)


Published in SPIE Proceedings Vol. 8206:
Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers
Jianda Shao, Editor(s)

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