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Proceedings Paper

Investigation of optical surface damage detection with laser-induced fluorescence microscopy
Author(s): Zhixing Gao; Xiuzhang Tang
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Paper Abstract

Fluorescence microscopy is a useful tool to image defect nanostructures in the bulk of dielectric materials. The application of microscopy with laser-induced fluorescence on optics to detect the damage of optical films was explored. A fluorescence image system was built that incorporated in-situ damage testing capabilities. The experimental results was checked under an ex-situ Nomarski microscope.

Paper Details

Date Published: 12 January 2012
PDF: 6 pages
Proc. SPIE 8206, Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers, 82061N (12 January 2012); doi: 10.1117/12.910473
Show Author Affiliations
Zhixing Gao, China Institute of Atomic Energy (China)
Xiuzhang Tang, China Institute of Atomic Energy (China)


Published in SPIE Proceedings Vol. 8206:
Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers
Jianda Shao, Editor(s)

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