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Proceedings Paper

Self-similarity of time evolution of photodarkening losses induced in Yb-doped fibers and photodarkening figure of merit
Author(s): Stefano Taccheo; Hrvoje Gebavi; Achille Monteville; Olivier Le Goffic; Daniel Landais; David Mechin; Denis Tregoat; Benoit Cadier; Thierry Robin; Daniel Milanese; Tim Durrant
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Paper Abstract

In this paper we report and summarize an extensive investigation of photodarkening in Yb-doped silica fibers. We made a set of similar fibers in order to cover a large Yb concentration range. The results show that once uniform inversion is reached all along the test fiber it is possible to show self-similarity of the time evolutions. The stretching parameter has a little influence. We can therefore provide two unique numbers to define photodarkening performance: the saturation loss and the time scale parameter. We also propose a possible figure of merit to compare different fibers. This may allow to evaluate the impact of photodarkening on laser/amplifier devices.

Paper Details

Date Published: 15 February 2012
PDF: 6 pages
Proc. SPIE 8237, Fiber Lasers IX: Technology, Systems, and Applications, 82373D (15 February 2012); doi: 10.1117/12.910382
Show Author Affiliations
Stefano Taccheo, Swansea Univ. (United Kingdom)
Hrvoje Gebavi, Swansea Univ. (United Kingdom)
Achille Monteville, Plate-forme d'Étude et de Recherche sur les Fibres Optiques Spéciales (France)
Olivier Le Goffic, Plate-forme d'Étude et de Recherche sur les Fibres Optiques Spéciales (France)
Daniel Landais, Plate-forme d'Étude et de Recherche sur les Fibres Optiques Spéciales (France)
David Mechin, Plate-forme d'Étude et de Recherche sur les Fibres Optiques Spéciales (France)
Denis Tregoat, Plate-forme d'Étude et de Recherche sur les Fibres Optiques Spéciales (France)
Benoit Cadier, iXFiber SAS (France)
Thierry Robin, iXFiber SAS (France)
Daniel Milanese, Politecnico di Torino (Italy)
Tim Durrant, Gooch & Housego Plc (United Kingdom)


Published in SPIE Proceedings Vol. 8237:
Fiber Lasers IX: Technology, Systems, and Applications
Eric C. Honea; Sami T. Hendow, Editor(s)

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