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Proceedings Paper

Application of frequency spectrum analysis in measuring multi-vibrations by using POTDR
Author(s): Xiangchuan Wang; Xuping Zhang; Feng Wang; Mengmeng Chen; Cunlei Li
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Paper Abstract

The technology of Polarization Optical Time Domain Reflectometer (POTDR) can be used to obtain the external events' information by measuring the change of state of polarization (SOP) of the Rayleigh backscattering in fiber. When the fiber is disturbed at two different positions simultaneously, we analyze the frequency spectrums of the change of Rayleigh backscattering light which are obtained by POTDR theoretically for ideal fiber, and by numerical simulation for single mode fibers. We find that the frequency spectrums between the first and second events contain the first vibration's frequency and its frequency multiplication. The frequency components of the spectrums after the second event are the linear combination of the first and the second events' frequencies. So we can obtain the location and the frequency information of the two events by analyzing the frequency spectrums. In addition, the frequency distribution in the frequency spectrums from different positions are different because of the different initial SOPs at different positions. So all the actual frequency information can not be obtained from only one frequency spectrum. We add up the frequency spectrums from the positions within a beat length to obtain the perturbation's frequency and the method can reduce the misdiagnosis rate because the sum of the frequency spectrums contains all the initial SOP within a beat length.

Paper Details

Date Published: 5 December 2011
PDF: 10 pages
Proc. SPIE 8198, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration, 819808 (5 December 2011); doi: 10.1117/12.910376
Show Author Affiliations
Xiangchuan Wang, Nanjing Univ. (China)
Xuping Zhang, Nanjing Univ. (China)
Feng Wang, Nanjing Univ. (China)
Mengmeng Chen, Nanjing Univ. (China)
Cunlei Li, Nanjing Univ. (China)


Published in SPIE Proceedings Vol. 8198:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration
Xuping Zhang; P. K. Alex Wai; Hai Ming, Editor(s)

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