Share Email Print
cover

Proceedings Paper

Laser-induced breakdown spectroscopy with improved spectral resolutions through the generation of high-temperature and low-density plasmas
Author(s): X. N. He; L. B. Guo; Z. Q. Xie; X. Huang; W. Hu; X. Y. Zeng; Y. F. Lu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Improved spectral resolutions were achieved in laser-induced breakdown spectroscopy (LIBS) through generation of high-temperature and low-density plasmas. A first pulse from a KrF excimer laser was used to produce particles by perpendicularly irradiating targets in air. A second pulse from a 532 nm Nd:YAG laser was introduced parallel to the sample surface to reablate the particles. Optical scattering from the first-pulse plasmas was imaged to elucidate particle formation in the plasmas. Narrower line widths (full width at half maximums: FWHMs) and weaker self-absorption were observed from time-integrated LIBS spectra. Estimation of plasma temperatures and densities indicates that high temperature and low density can be achieved simultaneously in plasmas to improve LIBS resolutions.

Paper Details

Date Published: 20 February 2012
PDF: 9 pages
Proc. SPIE 8244, Laser-based Micro- and Nanopackaging and Assembly VI, 82440H (20 February 2012); doi: 10.1117/12.910352
Show Author Affiliations
X. N. He, Univ. of Nebraska-Lincoln (United States)
L. B. Guo, Univ. of Nebraska-Lincoln (United States)
Wuhan National Lab. for Optoelectronics (China)
Z. Q. Xie, Univ. of Nebraska-Lincoln (United States)
X. Huang, Univ. of Nebraska-Lincoln (United States)
W. Hu, Univ. of Nebraska-Lincoln (United States)
X. Y. Zeng, Wuhan National Lab. for Optoelectronics (China)
Y. F. Lu, Univ. of Nebraska-Lincoln (United States)


Published in SPIE Proceedings Vol. 8244:
Laser-based Micro- and Nanopackaging and Assembly VI
Friedrich G. Bachmann; Wilhelm Pfleging; Kunihiko Washio; Jun Amako; Willem Hoving; Yongfeng Lu, Editor(s)

© SPIE. Terms of Use
Back to Top