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Proceedings Paper

Polarization-resolved optical metrology for noncontact thermometry
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Paper Abstract

Noncontact temperature measurements with large (thermal) dynamic range are desirable in many applications. Aside from interferometric techniques, fluorescence intensity and spectral shape have been exploited in the past for sensitive thermometry in luminescent materials. Here, we present a novel method that utilizes the polarization-sensitive reflection and/or transmission of light from (through) an optical material without relying on any fluorescence. A balanced photodetector will measure the difference signal corresponding to two orthogonal polarization states with high singal-tonoise ratio. Temperature resolution of 5 mK have been demonstrated.

Paper Details

Date Published: 8 February 2012
PDF: 5 pages
Proc. SPIE 8275, Laser Refrigeration of Solids V, 82750J (8 February 2012); doi: 10.1117/12.910342
Show Author Affiliations
M. Ghasemkhani, The Univ. of New Mexico (United States)
D. V. Seletskiy, Air Force Research Lab. (United States)
The Univ. of New Mexico (United States)
M. Sheik-Bahae, The Univ. of New Mexico (United States)

Published in SPIE Proceedings Vol. 8275:
Laser Refrigeration of Solids V
Richard I. Epstein; Mansoor Sheik-Bahae, Editor(s)

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