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Proceedings Paper

Thermal imaging with high spatial and temperature resolution
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Paper Abstract

Based on a highly sensitive dierential spectroscopy technique, we present a non-contact method of optical- scanning thermal imaging with a possibility of sub-thermal-wavelength spatial resolution. This technique is general and can also be applied to imaging of strain or impurity distributions at the surfaces of semiconductors. This procedure is particularly well suited for near-eld imaging and investigation of thermal transport on the nanoscale. Applications to optical refrigeration in semiconductors are discussed.

Paper Details

Date Published: 8 February 2012
PDF: 5 pages
Proc. SPIE 8275, Laser Refrigeration of Solids V, 82750H (8 February 2012); doi: 10.1117/12.910271
Show Author Affiliations
Denis V. Seletskiy, The Univ. of New Mexico (United States)
Air Force Research Lab. (United States)
Seth D. Melgaard, The Univ. of New Mexico (United States)
Mansoor Sheik-Bahae, The Univ. of New Mexico (United States)

Published in SPIE Proceedings Vol. 8275:
Laser Refrigeration of Solids V
Richard I. Epstein; Mansoor Sheik-Bahae, Editor(s)

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