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Proceedings Paper

High-dynamic-range 4-Mpixel CMOS image sensor for scientific applications
Author(s): Paul Vu; Boyd Fowler; Chiao Liu; Steve Mims; Peter Bartkovjak; Hung Do; Wang Li; Jeff Appelbaum; Angel Lopez
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Paper Abstract

As bio-technology transitions from research and development to high volume production, dramatic improvements in image sensor performance will be required to support the throughput and cost requirements of this market. This includes higher resolution, higher frame rates, higher quantum efficiencies, increased system integration, lower read-noise, and lower device costs. We present the performance of a recently developed low noise 2048(H) x 2048(V) CMOS image sensor optimized for scientific applications such as life science imaging, microscopy, as well as industrial inspection applications. The sensor architecture consists of two identical halves which can be operated independently and the imaging array consists of 4T pixels with pinned photodiodes on a 6.5μm pitch with integrated micro-lens. The operation of the sensor is programmable through a SPI interface. The measured peak quantum efficiency of the sensor is 73% at 600nm, and the read noise is about 1.1e- RMS at 100 fps data rate. The sensor features dual gain column parallel ouput amplifiers with 11-bit single slope ADCs. The full well capacity is greater than 36ke-, the dark current is less than 7pA/cm2 at 20°C. The sensor achieves an intra-scene linear dynamic range of greater than 91dB (36000:1) at room temperature.

Paper Details

Date Published: 15 February 2012
PDF: 10 pages
Proc. SPIE 8298, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, 82980D (15 February 2012); doi: 10.1117/12.910148
Show Author Affiliations
Paul Vu, BAE Systems Imaging Solutions (United States)
Boyd Fowler, BAE Systems Imaging Solutions (United States)
Chiao Liu, BAE Systems Imaging Solutions (United States)
Steve Mims, BAE Systems Imaging Solutions (United States)
Peter Bartkovjak, BAE Systems Imaging Solutions (United States)
Hung Do, BAE Systems Imaging Solutions (United States)
Wang Li, BAE Systems Imaging Solutions (United States)
Jeff Appelbaum, BAE Systems Imaging Solutions (United States)
Angel Lopez, BAE Systems Imaging Solutions (United States)


Published in SPIE Proceedings Vol. 8298:
Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII
Ralf Widenhorn; Valérie Nguyen; Antoine Dupret, Editor(s)

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