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Proceedings Paper

A reflection-mode configuration for enhanced light delivery through turbidity
Author(s): Timothy R. Hillman; Youngwoon Choi; Niyom Lue; Yongjin Sung; Ramachandra R. Dasari; Wonshik Choi; Zahid Yaqoob
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Paper Abstract

We propose a method based on wavefront shaping for enhancing the backscattered light detected from any location in a sample medium, using low-coherence interferometry. The lateral phase profile of the light incident upon the sample is controlled using a spatial light modulator (SLM). In this manner, we apply an orthogonal set of phase masks to the illumination (input) and measure the backscattered signal response (output). These measurements permit us to determine the linear transformation between the input complex-amplitude modulation profile and the output time-resolved signal. Thus, we can determine the appropriate SLM write pattern for maximizing the detected signal for a given optical time delay (in the sample arm). In this manuscript, we are interested in the degree to which maximizing this signal also permits us to localize the three-dimensional sample region from which the backscattered signal is derived.

Paper Details

Date Published: 10 February 2012
PDF: 6 pages
Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82271T (10 February 2012); doi: 10.1117/12.909735
Show Author Affiliations
Timothy R. Hillman, Massachusetts Institute of Technology (United States)
Youngwoon Choi, Massachusetts Institute of Technology (United States)
Korea Univ. (Korea, Republic of)
Niyom Lue, Massachusetts Institute of Technology (United States)
Yongjin Sung, Massachusetts Institute of Technology (United States)
Ramachandra R. Dasari, Massachusetts Institute of Technology (United States)
Wonshik Choi, Korea Univ. (Korea, Republic of)
Zahid Yaqoob, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 8227:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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