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Proceedings Paper

Self-referenced quantitative phase microscopy
Author(s): Timothy R. Hillman; Niyom Lue; Yongjin Sung; Ramachandra R. Dasari; Peter T. C. So; Zahid Yaqoob
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Paper Abstract

Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample.

Paper Details

Date Published: 10 February 2012
PDF: 6 pages
Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82271S (10 February 2012); doi: 10.1117/12.909701
Show Author Affiliations
Timothy R. Hillman, Massachusetts Institute of Technology (United States)
Niyom Lue, Massachusetts Institute of Technology (United States)
Yongjin Sung, Massachusetts Institute of Technology (United States)
Ramachandra R. Dasari, Massachusetts Institute of Technology (United States)
Peter T. C. So, Massachusetts Institute of Technology (United States)
Zahid Yaqoob, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 8227:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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