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Proceedings Paper

Development of fibre Bragg grating based strain/temperature sensing system
Author(s): S. G. Raymond; P. Wagner; M. Panczyk; G. V. M. Williams; K. J. Stevens; I. Monfils; D. Hirst; J. Whaanga; Y. Kutuvantavida; M. D. H. Bhuiyan; A. J. Kay
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Paper Abstract

We have characterised a strain and temperature sensing system being developed by Southern Photonics that uses a new Optical Interrogator and fibre Bragg gratings. We have determined the key strain and temperature coefficients, and shown that strain and temperature can be measured simultaneously. The experimental uncertainty is 5.2 pm when using the 1540 nm fibre Bragg grating, which corresponds to an experimental uncertainty in measuring the temperature of 0.54 ºC and in measuring the strain of 3.4 με. Simulations predict that a Bragg reflection of more than 90% can be achieved for Bragg Gratings in polymer thin films containing chromophores for grating lengths as small as 200 μm. A small Bragg grating length means that it should be possible to create waveguides and four Bragg gratings for strain tensor and temperature measurements within an area as small as 5×5 mm2.

Paper Details

Date Published: 20 February 2012
PDF: 8 pages
Proc. SPIE 8258, Organic Photonic Materials and Devices XIV, 82581L (20 February 2012); doi: 10.1117/12.909344
Show Author Affiliations
S. G. Raymond, Industrial Research Ltd. (New Zealand)
P. Wagner, Univ. of Applied Science Darmstadt (Germany)
M. Panczyk, Univ. of Applied Science Darmstadt (Germany)
G. V. M. Williams, MacDiarmid Institute for Advanced Materials and Nanotechnology (New Zealand)
K. J. Stevens, Quest Integrity Group NZL, Ltd. (New Zealand)
I. Monfils, Southern Photonics Ltd. (New Zealand)
D. Hirst, Southern Photonics Ltd. (New Zealand)
J. Whaanga, Industrial Research Ltd. (New Zealand)
Y. Kutuvantavida, Industrial Research Ltd. (New Zealand)
M. D. H. Bhuiyan, Industrial Research Ltd. (New Zealand)
A. J. Kay, Industrial Research Ltd. (New Zealand)


Published in SPIE Proceedings Vol. 8258:
Organic Photonic Materials and Devices XIV
Christopher Tabor; François Kajzar; Toshikuni Kaino; Yasuhiro Koike, Editor(s)

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