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Proceedings Paper

Simultaneous quantitative depth mapping and extended depth of field for 4D microscopy through PSF engineering
Author(s): Ramzi N. Zahreddine; Robert H. Cormack; Carol J. Cogswell
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Paper Abstract

An extended depth of field (EDF) microscope that allows for quantitative axial positioning has been constructed. Past work has shown that EDF microscopy allows for features in varying planes to appear sharply focused simultaneously, however an inherent consequence of this is that depth information is lost. Here, a specifically engineered phase plate is used to create a point spread function (PSF) that contains both of the necessary attributes for extended depth of field and quantitative depth mapping. A two-camera solution is used to separate and capture the information for individualized post processing. The result is a microscope that can serve as an essential tool for full 3D, real-time imaging.

Paper Details

Date Published: 11 February 2012
PDF: 7 pages
Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 822705 (11 February 2012); doi: 10.1117/12.909273
Show Author Affiliations
Ramzi N. Zahreddine, Univ. of Colorado at Boulder (United States)
Robert H. Cormack, Univ. of Colorado at Boulder (United States)
Carol J. Cogswell, Univ. of Colorado at Boulder (United States)


Published in SPIE Proceedings Vol. 8227:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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