Share Email Print
cover

Proceedings Paper

High order mode long-period fiber grating refractive index sensor based on intensity measurement
Author(s): Xinwei Lan; Qun Han; Jie Huang; Xia Fang; Tao Wei; Zhan Gao; Hai Xiao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Long-period fiber gratings have been used for refractive index measurements under different conditions. Normally, this kind of sensor is based on measuring resonance wavelength shift with respect to different refractive index environments. As high order mode long period fiber gratings are attracting more attention, a new methodology based on intensity measurement of turning points is introduced, which involves simple experiment setup and straightforward demodulation process compared with wavelength shift based method. By using CO2 laser point by point irradiation method, high order mode gratings working at turning point can be easily fabricated. This type of grating has a very high sensitive response to surrounding refractive index, which can be used in chemical, medical and bio applications. In this paper, high sensitive refractive index sensor is demonstrated based on high order mode using intensity measurement. Phase match curve and couple mode theory are combined to analyze the intensity response to refractive index change at turning point of LPFG. This sensor is also demonstrated as an effective refractive index based glucose sensor with a range from 0 to 40 mM concentration of glucose solution, which can fulfill the medical requirement.

Paper Details

Date Published: 2 March 2012
PDF: 7 pages
Proc. SPIE 8257, Optical Components and Materials IX, 82570J (2 March 2012); doi: 10.1117/12.909255
Show Author Affiliations
Xinwei Lan, Missouri Univ. of Science and Technology (United States)
Qun Han, Missouri Univ. of Science and Technology (United States)
Tianjin Univ. (China)
Jie Huang, Missouri Univ. of Science and Technology (United States)
Xia Fang, Missouri Univ. of Science and Technology (United States)
Tao Wei, Missouri Univ. of Science and Technology (United States)
Zhan Gao, Missouri Univ. of Science and Technology (United States)
Hai Xiao, Missouri Univ. of Science and Technology (United States)


Published in SPIE Proceedings Vol. 8257:
Optical Components and Materials IX
Shibin Jiang; Michel J. F. Digonnet; J. Christopher Dries, Editor(s)

© SPIE. Terms of Use
Back to Top