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Proceedings Paper

Dynamic CCD pixel depletion edge model and the effects on dark current production
Author(s): Justin C. Dunlap; M. M. Blouke; Erik Bodegom; Ralf Widenhorn
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Paper Abstract

The depletion edge in Charge-Coupled Devices (CCD) pixels is dependent upon the amount of signal charge located within the depletion region. A model is presented that describes the movement of the depletion edge with increasing signal charge. This dynamic depletion edge is shown to have an effect on the amount of dark current produced by some pixels. Modeling the dark current behavior of pixels both with and without impurities over an entire imager demonstrates that this moving depletion edge has a significant effect on a subset of the pixels. Dark current collected by these pixels is shown to behave nonlinearly with respect to exposure time and additionally the dark current is affected by the presence of illumination. The model successfully predicts unexplained aspects of dark current behavior previously observed in some CCD sensors.

Paper Details

Date Published: 15 February 2012
PDF: 8 pages
Proc. SPIE 8298, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, 82980F (15 February 2012); doi: 10.1117/12.909217
Show Author Affiliations
Justin C. Dunlap, Portland State Univ. (United States)
M. M. Blouke, Portland State Univ. (United States)
Erik Bodegom, Portland State Univ. (United States)
Ralf Widenhorn, Portland State Univ. (United States)


Published in SPIE Proceedings Vol. 8298:
Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII
Ralf Widenhorn; Valérie Nguyen; Antoine Dupret, Editor(s)

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