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Proceedings Paper

Optical waveguide end roughness in correlation to optical coupling
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Paper Abstract

With the ever-increasing demand for board-to-board optical data communications, the correlation between waveguide surface end roughness and coupling losses must be thoroughly investigated. This study measures end roughness of siloxane polymer optical waveguides in terms of optical coupling losses. Siloxane Polymers from Dow Corning were used to fabricate 50 x 50 μm rectangular waveguides through photolithographic processes. Edge roughness was controlled through various grades of fiber-optic polishing films and then measured using interferometric microscopy (IFM). Controlled lab results are compared with industrial polishing techniques that are consistent with mass-production methods. Electromagnetic modeling revealed correlations between experimental and theoretical results.

Paper Details

Date Published: 23 February 2012
PDF: 7 pages
Proc. SPIE 8267, Optoelectronic Interconnects XII, 82670N (23 February 2012); doi: 10.1117/12.908847
Show Author Affiliations
Kevin Kruse, Michigan Technological Univ. (United States)
Nick Riegel, Michigan Technological Univ. (United States)
Casey Demars, Calumet Electronics Corp. (United States)
Christopher Middlebrook, Michigan Technological Univ. (United States)
Michael Roggemann, Michigan Technological Univ. (United States)


Published in SPIE Proceedings Vol. 8267:
Optoelectronic Interconnects XII
Alexei L. Glebov; Ray T. Chen, Editor(s)

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