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Proceedings Paper

Investigation of birefringence uniformity of mid-IR nonlinear optical crystals
Author(s): Benjamin R. Johnson; Kevin T. Zawilski; Peter G. Schunemann; P. Randall Staver; Thomas M. Pollak; Evan P. Chickilis
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Paper Abstract

An investigation of the birefringence uniformity of mid-IR non-linear optical crystals has been conducted in an effort to improve the performance of crystals used in OPO converters. This paper discusses the development of an imaging polarimeter operating at 2 μm for the characterization of birefringence uniformity of nonlinear optical crystals for use in mid-IR generation. The spatial distribution of optical in-homogeneity is directly revealed in terms of optical rotation in the polarimeter. The root cause for the optical rotation observed in the polarimeter is discussed in terms of fluctuations in the material birefringence, or excess birefringence. Excess birefringence on the order of ▵n=10-4 are measured in samples exhibiting the rare occurrence of low birefringence uniformity in our mid-IR nonlinear optical crystals.

Paper Details

Date Published: 16 February 2012
PDF: 7 pages
Proc. SPIE 8240, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications XI, 824016 (16 February 2012); doi: 10.1117/12.908764
Show Author Affiliations
Benjamin R. Johnson, BAE Systems, Inc. (United States)
Kevin T. Zawilski, BAE Systems, Inc. (United States)
Peter G. Schunemann, BAE Systems, Inc. (United States)
P. Randall Staver, BAE Systems, Inc. (United States)
Thomas M. Pollak, BAE Systems, Inc. (United States)
Evan P. Chickilis, BAE Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 8240:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications XI
Konstantin L. Vodopyanov, Editor(s)

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