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Proceedings Paper

Measuring ionizing radiation with a mobile device
Author(s): Matthias Michelsburg; Thomas Fehrenbach; Fernando Puente León
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Paper Abstract

In cases of nuclear disasters it is desirable to know one's personal exposure to radioactivity and the related health risk. Usually, Geiger-Mueller tubes are used to assess the situation. Equipping everyone with such a device in a short period of time is very expensive. We propose a method to detect ionizing radiation using the integrated camera of a mobile consumer device, e.g., a cell phone. In emergency cases, millions of existing mobile devices could then be used to monitor the exposure of its owners. In combination with internet access and GPS, measured data can be collected by a central server to get an overview of the situation. During a measurement, the CMOS sensor of a mobile device is shielded from surrounding light by an attachment in front of the lens or an internal shutter. The high-energy radiation produces free electrons on the sensor chip resulting in an image signal. By image analysis by means of the mobile device, signal components due to incident ionizing radiation are separated from the sensor noise. With radioactive sources present significant increases in detected pixels can be seen. Furthermore, the cell phone application can make a preliminary estimate on the collected dose of an individual and the associated health risks.

Paper Details

Date Published: 9 February 2012
PDF: 10 pages
Proc. SPIE 8304, Multimedia on Mobile Devices 2012; and Multimedia Content Access: Algorithms and Systems VI, 83040A (9 February 2012); doi: 10.1117/12.908757
Show Author Affiliations
Matthias Michelsburg, Karlsruhe Institute of Technology (Germany)
Thomas Fehrenbach, Karlsruhe Institute of Technology (Germany)
Fernando Puente León, Karlsruhe Institute of Technology (Germany)

Published in SPIE Proceedings Vol. 8304:
Multimedia on Mobile Devices 2012; and Multimedia Content Access: Algorithms and Systems VI
Cees G. M. Snoek; Reiner Creutzburg; Nicu Sebe; David Akopian; Lyndon Kennedy, Editor(s)

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