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Proceedings Paper

Dispersion analysis of subwavelength square apertures at optical frequencies
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Paper Abstract

We present an analytical study of resonance properties of square subwavelength apertures at optical and near-IR frequencies. This approach allows accurate prediction of resonance responses, captures both propagating and evanescent modes, and can easily be implemented in other analytical techniques. In this approach we avoid analyzing the detailed behavior of the fields inside the metal walls, but still obtain the effects of the buildup of charges within those walls. We calculate the dispersion relation and find the cutoff frequency's dependence on cavity dimensions for a square aperture embedded in a silver film, and support our findings with finite-element simulations.

Paper Details

Date Published: 28 February 2012
PDF: 7 pages
Proc. SPIE 8255, Physics and Simulation of Optoelectronic Devices XX, 82550R (28 February 2012); doi: 10.1117/12.908756
Show Author Affiliations
Eli Lansey, The City College of New York (United States)
Jonah N. Gollub, Phoebus Optoelectronics, LLC (United States)
David T. Crouse, The City College of New York (United States)

Published in SPIE Proceedings Vol. 8255:
Physics and Simulation of Optoelectronic Devices XX
Bernd Witzigmann; Marek Osinski; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)

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