Share Email Print

Proceedings Paper

High precision geometrical characterization and alignment of miniaturized optics
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Miniaturized optical systems like endoscopy or cell phone lenses systems comprise several optical elements like lenses, doublets and plane optics. To receive a good imaging quality the distances and angles between the different optical elements have to be as accurate as possible. In the first step we will describe how the distances and angles between different elements can be monitored and finally we will describe a technique to actively align small optics (diameter approx. 1mm and smaller) with respect to each other. For the measurement electronic autocollimators combined with white-light-interferometers are used. The electronic autocollimator reveals the exact centration errors between optical elements and the low coherence interferometer reveals the distances between surfaces. The accuracy of the centration error measurement is in the range of 0.1μm and the accuracy of the distance measurement is 1μm. Both methods can be applied to assembled multi-element optics. That means geometrical positions of all single surfaces of the final optical system can be analysed without loss of information. Both measurement techniques complement one another. Once the exact x,y,z - Position of each optical surface and element is known computer controlled actuators will be used to improve the alignment of the optics. For this purpose we use piezo-electric-actuators. This method had been applied to cement e.g. doublets for endoscope optics. In this case the optical axis of one lens has been aligned with respect to the optical axis of a second reference lens. Traditional techniques usually rely on an uncertain mechanical reference.

Paper Details

Date Published: 14 February 2012
PDF: 6 pages
Proc. SPIE 8249, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics V, 82490U (14 February 2012); doi: 10.1117/12.908727
Show Author Affiliations
Patrik Langehanenberg, TRIOPTICS GmbH (Germany)
Josef Heinisch, TRIOPTICS GmbH (Germany)
Eugen Dumitrescu, TRIOPTICS GmbH (Germany)

Published in SPIE Proceedings Vol. 8249:
Advanced Fabrication Technologies for Micro/Nano Optics and Photonics V
Winston V. Schoenfeld; Raymond C. Rumpf; Georg von Freymann, Editor(s)

© SPIE. Terms of Use
Back to Top