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Proceedings Paper

Ion beams as a tool for the characterization of near-pseudomorphic CdZnO epilayers
Author(s): A. Redondo-Cubero; M. Brandt; F. Henneberger; E. Alves; K. Lorenz
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Paper Abstract

In this paper we show the application of Rutherford backscattering spectrometry and ion channeling (RBS/C) for the detection of compositional and strain gradients in CdZnO grown almost pseudomorphically on MgZnO. The asymmetric features revealed in X-ray diffraction studies were explained by the compositional gradient found in the first 100 nm close to the interface. Calculations of the effect of such a gradient on the strain state of the layer were developed and contrasted with RBS/C angular scans. Additionally, the substitutional behavior of Cd (and Mg) in Zn-sites was demonstrated.

Paper Details

Date Published: 1 March 2012
PDF: 14 pages
Proc. SPIE 8263, Oxide-based Materials and Devices III, 82630U (1 March 2012); doi: 10.1117/12.908496
Show Author Affiliations
A. Redondo-Cubero, Instituto Tecnológico e Nuclear (Portugal)
Univ. Nova de Lisboa (Portugal)
M. Brandt, Humboldt-Univ. zu Berlin (Germany)
F. Henneberger, Humboldt-Univ. zu Berlin (Germany)
E. Alves, Instituto Tecnológico e Nuclear (Portugal)
Univ. Nova de Lisboa (Portugal)
K. Lorenz, Instituto Tecnológico e Nuclear (Portugal)
Univ. Nova de Lisboa (Portugal)


Published in SPIE Proceedings Vol. 8263:
Oxide-based Materials and Devices III
Ferechteh H. Teherani; David C. Look; David J. Rogers, Editor(s)

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