Share Email Print
cover

Proceedings Paper

Star test polarimetry using stress-engineered optical elements
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Stress-engineered optical elements have potential applications in snapshot polarimetry, in which a single irradiance image is used to measure a spatially varying polarization. In this paper, we present star test polarimetry which is a method of polarization retrieval by analyzing a single frame point spread function. A trigonally stressed window placed at the pupil plane of an imaging system is used to produce point spread functions which are then processed to extract the polarization state of the incoming beam under investigation. We outline several methods which are used to recover the Stokes parameters of a beam of unknown polarization from the irradiance distribution of its point spread function.

Paper Details

Date Published: 2 February 2012
PDF: 8 pages
Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82270Q (2 February 2012); doi: 10.1117/12.908472
Show Author Affiliations
Roshita Ramkhalawon, The Institute of Optics, Univ. of Rochester (United States)
Amber M. Beckley, The Institute of Optics, Univ. of Rochester (United States)
Thomas G. Brown, The Institute of Optics, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 8227:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

© SPIE. Terms of Use
Back to Top