
Proceedings Paper
Reducing the spectral width of high speed oxide confined VCSELs using an integrated mode filterFormat | Member Price | Non-Member Price |
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Paper Abstract
We have reduced the spectral width of high speed oxide confined 850 nm VCSELs using a shallow surface relief for
suppression of higher order transverse modes. The surface relief acts as a mode filter by introducing a spatially varying
and therefore mode selective loss. The VCSEL employs multiple oxide layers for reduced capacitance which leads to a
strong index guiding and a large spectral width in the absence of a mode filter. With an appropriate choice of surface
relief parameters, the RMS spectral width for a 5 μm oxide aperture VCSEL is reduced from 0.6 to 0.3 nm. The small
signal modulation bandwidth is 19 GHz. Due to reduced effects of chromatic and modal fiber dispersion, the maximum
error-free (bit-error-rate < 10-12) transmission distance at 25 Gb/s over OM3+ fiber is increased from 100 to 500 m.
Paper Details
Date Published: 7 February 2012
PDF: 8 pages
Proc. SPIE 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760L (7 February 2012); doi: 10.1117/12.908424
Published in SPIE Proceedings Vol. 8276:
Vertical-Cavity Surface-Emitting Lasers XVI
Chun Lei; Kent D. Choquette, Editor(s)
PDF: 8 pages
Proc. SPIE 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760L (7 February 2012); doi: 10.1117/12.908424
Show Author Affiliations
Erik Haglund, Chalmers Univ. of Technology (Sweden)
Åsa Haglund, Chalmers Univ. of Technology (Sweden)
Johan S. Gustavsson, Chalmers Univ. of Technology (Sweden)
Åsa Haglund, Chalmers Univ. of Technology (Sweden)
Johan S. Gustavsson, Chalmers Univ. of Technology (Sweden)
Benjamin Kögel, Chalmers Univ. of Technology (Sweden)
Petter Westbergh, Chalmers Univ. of Technology (Sweden)
Anders Larsson, Chalmers Univ. of Technology (Sweden)
Petter Westbergh, Chalmers Univ. of Technology (Sweden)
Anders Larsson, Chalmers Univ. of Technology (Sweden)
Published in SPIE Proceedings Vol. 8276:
Vertical-Cavity Surface-Emitting Lasers XVI
Chun Lei; Kent D. Choquette, Editor(s)
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