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Proceedings Paper

Evaluation of water film thickness on contact lens by improved reflectometry technique
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Paper Abstract

We report the evaluation of water film on a contact lens using an improved optical reflectometry technique. A galvanometer scanner is added to an optical reflectometry system for fast measurement beam alignment. Light from a Tungsten Halogen light source travel down a 2×1 fiber coupler, go through the focusing lens and the galvanometer scanner, and light up the water film on the contact lens. The air/water and water/contact lens interfaces reflect the light back to the fiber, where the spectral dependent reflection data is acquired by the fiber coupled spectrometer for analysis. From the reflective spectra, the water film thickness can be calculated using predictor-corrector curve fitting method. In the scanning selection and the curve fitting calculation, a band stop filter is applied to the reflectance spectrum to eliminate data noise.

Paper Details

Date Published: 9 March 2012
PDF: 5 pages
Proc. SPIE 8209, Ophthalmic Technologies XXII, 82091S (9 March 2012); doi: 10.1117/12.908321
Show Author Affiliations
Hui Lu, Univ. of Miami (United States)
Michael R. Wang, Univ. of Miami (United States)
Jianhua Wang, Bascom Palmer Eye Institute, Univ. of Miami (United States)


Published in SPIE Proceedings Vol. 8209:
Ophthalmic Technologies XXII
Fabrice Manns; Per G. Söderberg; Arthur Ho, Editor(s)

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