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Proceedings Paper

Laser-induced transient stress distribution inside a single crystal by time-resolved birefringence imaging
Author(s): Takaya Tochio; Masaaki Sakakura; Shingo Kanehira; Yasuhiko Shimotsuma; Kiyotaka Miura; Kazuyuki Hirao
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Paper Abstract

When femtosecond laser pulses are focused inside a single crystal, anisotropic structural changes such as dislocation and cleavage occur along specific orientations. It can be interpreted that the anisotropic structural changes should be induced by transient stress after photoexcitation, such as a thermal stress and stress wave. To elucidate the mechanism of the laser induced structural changes inside crystals, we developed a novel time-resolved polarization imaging system, in which circularly polarized laser pulse was used as a probe light. The system enabled us to observe laser-induced transient stress distribution as well as the orientation after focusing fs laser pulses inside MgO and LiF single crystals. Based on the observation, we elucidated the relation between laser-induced transient stress distribution and anisotropic structural change inside the crystals.

Paper Details

Date Published: 15 February 2012
PDF: 8 pages
Proc. SPIE 8243, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVII, 82430E (15 February 2012); doi: 10.1117/12.908186
Show Author Affiliations
Takaya Tochio, Kyoto Univ. (Japan)
Masaaki Sakakura, Kyoto Univ. (Japan)
Shingo Kanehira, Kyoto Univ. (Japan)
Yasuhiko Shimotsuma, Kyoto Univ. (Japan)
Kiyotaka Miura, Kyoto Univ. (Japan)
Kazuyuki Hirao, Kyoto Univ. (Japan)


Published in SPIE Proceedings Vol. 8243:
Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVII
Guido Hennig; Xianfan Xu; Bo Gu; Yoshiki Nakata, Editor(s)

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