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Proceedings Paper

Pulse repetition interval-based Excess Fraction method for an arbitrary and absolute distance measurement using a femtosecond optical frequency comb
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Paper Abstract

The fundamental importance of length measurement and traceability is clear. In July 2009, the national standard tool for measuring length in Japan changed from an iodine-stabilized helium-neon (He-Ne) laser to a femtosecond optical frequency comb (FOFC). Because of the great potential for a technological revolution in length measurement, FOFC based length measurement has attracted much attention from physicists and engineers. This paper is intended to give a description to the concept, the principle, and a demonstration of a new length measurement technique, called pulse repetition interval-based Excess Fraction (PRIEF) method, which was developed for an arbitrary and absolute length measurement that is directly linked to an FOFC. The basic idea of this new technique was inspired by the analogy between the wavelength of a monochromatic laser source and the pulse repetition interval of an FOFC. Just as a conventional Excess Fraction method can determine an arbitrary and absolute length of a gauge block based on the wavelength of a monochromatic laser source, the same Excess Fraction method can range an arbitrary and absolute length as a function of the pulse repetition interval of an FOFC. A demonstration of the proposed method is presented. A literature review of pulse laser based length measurement is also performed. From the result of the preliminary experiment and the literature review, it has been show the possibility that PRIEF method can be used for a high-accuracy distant evaluation.

Paper Details

Date Published: 30 January 2012
PDF: 11 pages
Proc. SPIE 8247, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XII, 82470K (30 January 2012); doi: 10.1117/12.907636
Show Author Affiliations
Dong Wei, The Univ. of Tokyo (Japan)
Kiyoshi Takamasu, The Univ. of Tokyo (Japan)
Hirokazu Matsumoto, The Univ. of Tokyo (Japan)


Published in SPIE Proceedings Vol. 8247:
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XII
Alexander Heisterkamp; Michel Meunier; Stefan Nolte, Editor(s)

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