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Proceedings Paper

New design method based on sagittal flat-field equipment of Offner type imaging spectrometer
Author(s): Yiqun Ji; Rudong Xue; Weimin Shen
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Paper Abstract

Based on the wave aberration theory, a new method of optical design of the planate symmetric Offner type imaging spectrometer is performed. Astigmatism changing with the diffraction angle of the grating, the meridional and saggital focusing characters are all studied. Determination of the initial configurations and optimally design methods of two improved types of Offner imaging spectrometer are discussed in detailed. A design example with the numerical aperture larger than 0.2, and the entrance slit 30mm is given. Its spectral resolution is better than 2nm and MTF is above 0.7@20lp/mm. The smile and keystone are less than 3% and 0.2% of the pixel respectively.

Paper Details

Date Published: 28 November 2011
PDF: 10 pages
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000D (28 November 2011); doi: 10.1117/12.907347
Show Author Affiliations
Yiqun Ji, Soochow Univ. (China)
Rudong Xue, Soochow Univ. (China)
Weimin Shen, Soochow Univ. (China)


Published in SPIE Proceedings Vol. 8200:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

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