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Proceedings Paper

Structured illumination confocal scanning microscope with enhanced optical resolution and acquisition speed
Author(s): Young-Duk Kim; MyoungKi Ahn; Dae-Gab Gweon
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Paper Abstract

There was a previous research that proposed the structured illumination confocal scanning microscope (SICSM) so as to improve the lateral resolution of the confocal microscope. However, the image acquisition speed of the SICSM was very slow and also an alignment error due to the mechanical rotation of a grating and a slit can easily occur. As a theoretical study, in this paper we propose a new SI method, the cross SI method, which improves lateral resolution and image acquisition speed. Performances of the conventional SI and the proposed SI methods are compared by analysis of the modulation transfer function. The proposed SI method shows similar lateral resolution and can shorten the image acquisition time compared to the conventional SI method. The cross structured illumination confocal microscope (CSICM) is combined with the cross SI pattern optics and the line scanning confocal microscope. We have introduced a 2-D diffractive grating in order to create the cross SI pattern. The effects of the cross SI pattern, intensity and visibility, on the system performance are analyzed. The CSICM has double the lateral resolution of the conventional microscope, an optical sectioning ability and a fast image acquisition speed.

Paper Details

Date Published: 13 February 2012
PDF: 8 pages
Proc. SPIE 8228, Single Molecule Spectroscopy and Superresolution Imaging V, 822812 (13 February 2012); doi: 10.1117/12.907188
Show Author Affiliations
Young-Duk Kim, KAIST (Korea, Republic of)
MyoungKi Ahn, KAIST (Korea, Republic of)
Dae-Gab Gweon, KAIST (Korea, Republic of)


Published in SPIE Proceedings Vol. 8228:
Single Molecule Spectroscopy and Superresolution Imaging V
Jörg Enderlein; Zygmunt Karol Gryczynski; Rainer Erdmann; Felix Koberling; Ingo Gregor, Editor(s)

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