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Proceedings Paper

Detection of extremely small polarization rotation angles based on magneto-optic modulation
Author(s): Simiao Han; Zongjun Huang; Qiang Huang; Jiuxing Li; Qiang Liu; Junhai Zhang; Weimin Sun
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Paper Abstract

We designed and built a measuring system to detect a very small optical rotation. The total measuring system consists of a laser, a Faraday modulator, a photo-detector, and a lock-in amplifier. To test the sensitivity of the system, we built another system to generate the small polarization rotation angle. The rotation-generating system includes a dense coil around a magneto-optic crystal, a power amplifier working at modulation frequency about 1 kHz. The rotationgenerating system can drive probe beam polarization by 2°due to the Faraday effect under 0-2 kHz modulation frequency. We monitor the frequency and amplitude of the modulating signal by observing the second harmonic signal received by the photo-detector. Some factors which influence the detection system have been analyzed experimentally to found the best working setup of the system. Recently we can detect an angle of magnitude at 10-6rad and the SNR of the output of the lock-in amplifier is above 331.The resolution of the angle detection is better than 10-7rad.

Paper Details

Date Published: 30 November 2011
PDF: 5 pages
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012E (30 November 2011); doi: 10.1117/12.907163
Show Author Affiliations
Simiao Han, Harbin Engineering Univ. (China)
Zongjun Huang, Harbin Engineering Univ. (China)
Qiang Huang, Harbin Engineering Univ. (China)
Jiuxing Li, Harbin Engineering Univ. (China)
Qiang Liu, Harbin Engineering Univ. (China)
Junhai Zhang, Harbin Engineering Univ. (China)
Weimin Sun, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 8201:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Xinyong Dong; Xiaoyi Bao; Perry Ping Shum; Tiegen Liu, Editor(s)

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