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Proceedings Paper

Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer
Author(s): Chih-Jen Yu; Yao-Teng Tseng; Kuei-Chu Hsu; Chien Chou
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Paper Abstract

Based on the equivalence theorem of a unitary optical system. We proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid crystal device (TNLCD) with full field resolution. The spatial distribution of three characteristic parameters of a TNLCD were measured by using a polarizer-sample-analyzer imaging ellipsometer, thus the untwisted phase retardation, cell thickness and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of its characteristic parameters. The measured results are very close to the design values provided by TNLCD manufacture. This method shows that both the system setup and parameters calculating process are quite simple. It would be more helpful to characterize a TNLCD in the manufacturing process.

Paper Details

Date Published: 28 February 2012
PDF: 7 pages
Proc. SPIE 8255, Physics and Simulation of Optoelectronic Devices XX, 82551T (28 February 2012); doi: 10.1117/12.907016
Show Author Affiliations
Chih-Jen Yu, Chang Gung Univ. (Taiwan)
Yao-Teng Tseng, Chang Gung Univ. (Taiwan)
National Central Univ. (Taiwan)
Kuei-Chu Hsu, National Central Univ. (Taiwan)
Unice E-O services Inc. (Taiwan)
Chien Chou, Chang Gung Univ. (Taiwan)

Published in SPIE Proceedings Vol. 8255:
Physics and Simulation of Optoelectronic Devices XX
Bernd Witzigmann; Marek Osinski; Fritz Henneberger; Yasuhiko Arakawa, Editor(s)

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