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Proceedings Paper

An experimental apparatus for normal spectral emissivity measurement
Author(s): Kun Yu; Yufang Liu; Guangrui Jia; Deheng Shi
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Paper Abstract

Based on the definition of spectral emissivity, an experimental apparatus for normal spectral emissivity measurement at different temperatures has been developed. The sample and blackbody are heated by the same heating system, which permits to measure spectral emissivity up to 1273K. The temperatures of the sample and blackbody are measured and controlled by an infrared radiation thermometer and PID controller. The signal detection is carried out by a silicon photo detector at 1.5 μm. The experimental results focus on the capability of the apparatus to perform emissivity measurements as a function of temperature at a fixed wavelength. Using this apparatus, the spectral emissivity of SUS304 is first measured at different temperatures. In order to validate the measurement capability of the apparatus for different sample, three kinds of steel samples which have different percentages of constituents were measured. The measurement uncertainty of the experimental apparatus is analyzed. The overall uncertainty of the apparatus estimated is about 5%.

Paper Details

Date Published: 6 December 2011
PDF: 8 pages
Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 81971C (6 December 2011); doi: 10.1117/12.907003
Show Author Affiliations
Kun Yu, Beijing Institute of Technology (China)
Xingyi Normal Univ. for Nationalities (China)
Yufang Liu, Beijing Institute of Technology (China)
Henan Normal Univ. (China)
Guangrui Jia, Beijing Institue of Technology (China)
Deheng Shi, Henan Normal Univ. (China)


Published in SPIE Proceedings Vol. 8197:
2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments

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