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Proceedings Paper

Measuring aberrations in the rat brain by a new coherence-gated wavefront sensor using a Linnik interferometer
Author(s): Jinyu Wang; Jean-Francois Leger; Jonas Binding; Claude Boccara; Sylvain Gigan; Laurent Bourdieu
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Paper Abstract

Wavefront distortions due to refractive index mismatch and tissue inhomogeneity may limit the resolution, contrast, signal strength and achievable imaging depth of microscope. Traditional Shack-Hartmann wavefront sensors can't be used in strongly scattering biological samples since there is no selection of the ballistic photons originating from the reference point in the sample amongst all the backscattered photons. In contrast, coherence-gated wavefront sensing (CGWS) allows the fast measurement of aberrations in scattering samples and therefore should permit adaptive corrections. We have implemented a new CGWS scheme based on a Linnik interferometer with Super Luminescent Emission Diode as low temporal coherence light source. Compared to the previously described CGWS system based on a femtosecond laser, its main advantages are the automatic compensation of dispersion between the two arms and its easy implementation on any microscope. The configuration of virtual Shack-Hartmann wavefront sensor for wavefront reconstruction was optimized, and the measurement precision was analyzed when multiple scattering was not negligible. In fresh rat brain slices, we successfully measured up to about 400 μm depth a known defocus aberration, obtained by axially displacing the coherence gate with respect to the actual focus in the sample.

Paper Details

Date Published: 2 February 2012
PDF: 7 pages
Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 822702 (2 February 2012); doi: 10.1117/12.906806
Show Author Affiliations
Jinyu Wang, Ecole Supérieure de Physique et de Chimie Industrielles (France)
Institut Langevin, ESPCI ParisTech, CNRS (France)
Jean-Francois Leger, Ecole Supérieure de Physique et de Chimie Industrielles (France)
Jonas Binding, Ecole Supérieure de Physique et de Chimie Industrielles (France)
Institut Langevin, ESPCI ParisTech, CNRS (France)
Claude Boccara, Institut Langevin, ESPCI ParisTech, CNRS (France)
Sylvain Gigan, Institut Langevin, ESPCI ParisTech, CNRS (France)
Laurent Bourdieu, Ecole Supérieure de Physique et de Chimie Industrielles (France)


Published in SPIE Proceedings Vol. 8227:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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