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Proceedings Paper

Impact of photon lifetime on thermal rollover in 850-nm high-speed VCSELs
Author(s): Prashant P. Baveja; Benjamin Kögel; Petter Westbergh; Johan S. Gustavsson; Åsa Haglund; Drew N. Maywar; Govind P. Agrawal; Anders Larsson
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Paper Abstract

We present an empirical thermal model for VCSELs based on extraction of temperature dependence of macroscopic VCSEL parameters from CW measurements. We apply our model to two, oxide-confined, 850-nm VCSELs, fabricated with a 9-μm inner-aperture diameter and optimized for high-speed operation. We demonstrate that for both these devices, the power dissipation due to linear heat sources dominates the total self-heating. We further show that reducing photon lifetime down to 2 ps drastically reduces absorption heating and improves device static performance by delaying the onset of thermal rollover. The new thermal model can identify the mechanisms limiting the thermal performance and help in formulating the design strategies to ameliorate them.

Paper Details

Date Published: 7 February 2012
PDF: 11 pages
Proc. SPIE 8276, Vertical-Cavity Surface-Emitting Lasers XVI, 82760V (7 February 2012); doi: 10.1117/12.906784
Show Author Affiliations
Prashant P. Baveja, Institute of Optics, Univ. of Rochester (United States)
Benjamin Kögel, Chalmers Univ. of Technology (Sweden)
Petter Westbergh, Chalmers Univ. of Technology (Sweden)
Johan S. Gustavsson, Chalmers Univ. of Technology (Sweden)
Åsa Haglund, Chalmers Univ. of Technology (Sweden)
Drew N. Maywar, Rochester Institute of Technology (United States)
Govind P. Agrawal, Institute of Optics, Univ. of Rochester (United States)
Anders Larsson, Chalmers Univ. of Technology (Sweden)


Published in SPIE Proceedings Vol. 8276:
Vertical-Cavity Surface-Emitting Lasers XVI
Chun Lei; Kent D. Choquette, Editor(s)

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