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Proceedings Paper

All-fiber broad-range self-sweeping Yb-doped fiber laser
Author(s): Ivan A. Lobach; Sergey A. Kablukov; Evgeniy V. Podivilov; Sergey A. Babin
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Paper Abstract

The effect of broad-range self-sweeping in Yb-doped fiber laser has been demonstrated experimentally for the first time. The self-sweeping effect is observed in an all-fiber laser configuration with a double-clad Yb-doped fiber and a cavity formed by a broad-band fiber loop mirror and Fresnel reflection from one cleaved end. The sweep range is limited by the width of the broad-band reflector and reaches up to 16nm. It is found that the self-sweeping effect is related to selfpulsations. So the sweep rate is increased with an increase in pump power and is decreased with increasing cavity length. RF and optical spectra (linewidth is measured to be not more than 100 MHz) show that during the evolution of a single pulse a small number of longitudinal modes take a part in lasing. Based on these results we propose a model describing dynamics of the laser frequency. The model is based on the spatial hole burning effect and the gain saturation in Yb laser transition, and takes into account self-pulsations of the laser. Theoretical estimation for pulse to pulse change of lasing frequency is in good agreement with experimental data.

Paper Details

Date Published: 15 February 2012
PDF: 7 pages
Proc. SPIE 8237, Fiber Lasers IX: Technology, Systems, and Applications, 82371C (15 February 2012); doi: 10.1117/12.906660
Show Author Affiliations
Ivan A. Lobach, Institute of Automation and Electrometry (Russian Federation)
Sergey A. Kablukov, Institute of Automation and Electrometry (Russian Federation)
Novosibirsk State Univ. (Russian Federation)
Evgeniy V. Podivilov, Institute of Automation and Electrometry (Russian Federation)
Novosibirsk State Univ. (Russian Federation)
Sergey A. Babin, Institute of Automation and Electrometry (Russian Federation)
Novosibirsk State Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 8237:
Fiber Lasers IX: Technology, Systems, and Applications
Eric C. Honea; Sami T. Hendow, Editor(s)

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