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Proceedings Paper

Effect of slit widths on wavelength calibration of a Czerny-Turner double monochromator
Author(s): Huiquan Ouyang; Caihong Dai; Bo Huang; Zhifeng Wu
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Paper Abstract

Wavelength calibration is important for monochromator and spectrograph before accurate application. In the case of a Czerny-Turner double monochromator, work have been down to find out the relationship between slit widths and wavelength error. We do wavelength calibration in different widths of entrance and exit slits, then get wavelength error. The result shows that different widths of entrance slit and exit slit lead to different wavelength error, and wavelength error can be presented as a function of wavelength and slit widths through curve fitting. Thus, correction can be done by solving this function before accurate measurement.

Paper Details

Date Published: 30 November 2011
PDF: 9 pages
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820122 (30 November 2011); doi: 10.1117/12.906614
Show Author Affiliations
Huiquan Ouyang, National Institute of Metrology (China)
Caihong Dai, National Institute of Metrology (China)
Bo Huang, National Institute of Metrology (China)
Zhifeng Wu, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8201:
2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Xinyong Dong; Xiaoyi Bao; Perry Ping Shum; Tiegen Liu, Editor(s)

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